elastic backscattering spectrometry
type: Concept
broader: ion beam analysis

aerosol in situ
type: Concept

instrument type
type: Concept
narrower: ion beam analysis

ACTRIS Vocabulary
type: ConceptScheme

ion beam analysis
type: Concept
related: aerosol in situ
narrower: particle elastic scattering spectrometry
narrower: particle induced gamma-ray emission spectrometry
narrower: elastic backscattering spectrometry
narrower: Rutherford backscattering spectrometry
narrower: particle induced X-ray emission spectrometry
definition: Determines the elemental composition of the surface layer of a sample by exposing atoms to a beam of MeV ions.
creator: https://orcid.org/0000-0002-3380-3470
broader: instrument type
in scheme: ACTRIS Vocabulary
contributor: https://orcid.org/0000-0001-6993-3149

particle elastic scattering spectrometry
type: Concept
broader: ion beam analysis

particle induced gamma-ray emission spectrometry
type: Concept
broader: ion beam analysis

Rutherford backscattering spectrometry
type: Concept
broader: ion beam analysis

particle induced X-ray emission spectrometry
type: Concept
broader: ion beam analysis