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... > data source > instrument > instrument type > light emission spectrometer > X-ray fluorescence spectrometer > total reflection X-ray fluorescence spectrometer
data source > instrument > instrument model > total reflection X-ray fluorescence spectrometer

PREFERRED TERM

total reflection X-ray fluorescence spectrometer  

DEFINITION

  • Measures the elemental composition of a sample by exciting the atoms in the sample with high-energy X-rays, and measuring the energy of the emitted fluorescense X-ray photons, where combination of emission line energies are characteristic for the elements. The incident X-ray beam impinges on the sample at angles of total reflection. This limits the analysis to the surface of the sample, but also limits the background noise of the analysis.

URI

https://vocabulary.actris.nilu.no/actris_vocab/totalreflectionX-rayfluorescencespectrometer

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