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data source > instrument > instrument type > ion beam analysis > particle induced X-ray emission spectrometry

PREFERRED TERM

particle induced X-ray emission spectrometry  

DEFINITION

  • Determines the elemental composition of the surface layer of a sample by exciting atoms with a beam of MeV ions, and measuring the frequency and intensity of induced X-ray emissions.

BROADER CONCEPT

URI

https://vocabulary.actris.nilu.no/actris_vocab/particleinducedX-rayemissionspectrometry

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